12.5PF Cylindrical Quartz Crystal Units X206032768KGB2SC
Cylindrical Quartz Crystal Units
,X206032768KGB2SC
,12.5PF Quartz Crystal Units
Electronic components 32.768KHZ 12.5PF 10PPM QUARTZ CRYSTAL UNITS X206032768KGB2SC Directly inserted cylindrical crystal oscillator
Part number:
Package type | Part number | Model Number |
2P 2060 | X206032768KGB2SC | YT-26 |
2P 3080 | X308032768KGB2SC | YT-38 |
Description:
Frequency (HZ) | 32.768KHZ |
Frequency offset (PPM) | ±10PPM |
Voltage (V)/ Load (PF) | 12.5PF |
Working Temperature | ,-20℃~+70℃ |
Dismensions (mm) | 2.0mmx6.0mm |
Reliability Test Items
1. Mechanical Performance Tests
Shock |
Orient the sample in any attitude and drop it three times from a height of 75 cm onto a hardwood board with a thickness of 3 cm
|
Vibration | Subject the sample to 1.5-minute cycles of frequencies of 10 to 55 Hz and amplitudes of 1.5mm for two hours in each of the X,Y, and Z directions, or 6 hours in total. |
Tensile strength of terminal | Apply a 1.5Kg tensile load to each terminal and sustain it for 30±5 seconds. |
Bending strength of terminal |
Apply a 0.5 Kg load to one of the terminals, and after tilting the main unit for 90°,restore to its original attitude. Then, tilt it in an opposite direction for 90°,and restore to its original attitude |
Solder ability | Dip terminals in RMA flux for5 ± 0.5 seconds. Under room temperature. Dip terminals in a 230±5℃ solder bath for 5±0.5 seconds. The solder shall leave an undipped terminal length of 2 mm at their base . |
Resistance to Soldering Heat |
Dip terminals in a 260±5℃ solder bath for 10±0.5 seconds. The solder shall leave an undipped terminal length of 2 mm at their base |
Leaking Test | Take measurements with a helium leakage detector,or measure insulation resistance under pressure. |
Specifications:
Specification Number | Specifications |
A | Any variation between the pre- and post-test frequencies shall remain within ±5ppm. The post-test equivalent series resistance shall remain within its specified tolerance range. |
B | Any variation between the pre- and post-test frequencies shall remain within ±10ppm. The post-test equivalent series resistance shall remain within its specified tolerance range |
C | After each test, no visible damage shall be manifested, nor shall the hermetic seal break down. |
D | At least 90% of each dipped area shall be covered by fresh solder |
E | 1×10-2 μPa.m3 /s Max or IR≥500MΩ |
Remark:Measurements shall be taken at 25±2℃,and after each test, the sample be exposed
to two hours at 25±2℃